发明授权
- 专利标题: Directional CVD process with optimized etchback
- 专利标题(中): 具有优化回蚀的定向CVD工艺
-
申请号: US09584355申请日: 2000-05-31
-
公开(公告)号: US06335261B1公开(公告)日: 2002-01-01
- 发明人: Wesley Natzle , Richard A. Conti , Laertis Economikos , Thomas Ivers , George D. Papasouliotis
- 申请人: Wesley Natzle , Richard A. Conti , Laertis Economikos , Thomas Ivers , George D. Papasouliotis
- 主分类号: H01L2100
- IPC分类号: H01L2100
摘要:
A method is described for filling a high-aspect-ratio feature, in which compatible deposition and etching steps are performed in a sequence. The feature is formed as an opening in a substrate having a surface; a fill material is deposited at the bottom of the feature and on the surface of the substrate; deposition on the surface adjacent the feature causes formation of an overhang structure partially blocking the opening. The fill material is then reacted with a reactant to form a solid reaction product having a greater specific volume than the fill material. The overhang structure is thus converted into a reaction product structure blocking the opening. The reaction product (including the reaction product structure) is then desorbed, thereby exposing unreacted fill material at the bottom of the feature. The depositing and reacting steps may be repeated, with a final depositing step to fill the feature. Each sequence of depositing, reacting and desorbing reduces the aspect ratio of the feature.