发明授权
- 专利标题: Method and system for high speed measuring of microscopic targets
- 专利标题(中): 用于高速测量微观目标的方法和系统
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申请号: US09035564申请日: 1998-03-05
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公开(公告)号: US06366357B1公开(公告)日: 2002-04-02
- 发明人: Donald J. Svetkoff , Donald B. T. Kilgus , Warren Lin , Jonathan S. Ehrmann
- 申请人: Donald J. Svetkoff , Donald B. T. Kilgus , Warren Lin , Jonathan S. Ehrmann
- 主分类号: G01B1124
- IPC分类号: G01B1124
摘要:
A system including confocal and triangulation-based scanners or subsystems provides data which is both acquired and processed under the control of a control algorithm to obtain information such as dimensional information about microscopic targets which may be “non-cooperative.” The “non-cooperative” targets are illuminated with a scanning beam of electromagnetic radiation such as laser light incident from a first direction. A confocal detector of the electromagnetic radiation is placed at a first location for receiving reflected radiation which is substantially optically collinear with the incident beam of electromagnetic radiation. The system includes a spatial filter for attenuating background energy. The triangulation-based subsystem also includes a detector of electromagnetic radiation which is placed at a second location which is non-collinear with respect to the incident beam. This detector has a position sensitive axis. Digital data is derived from signals produced by the detectors. In this way, data from at least one triangulation-based channel is acquired in parallel or sequentially with at least one slice of confocal image data having substantially perfect temporal and spatial registration with the triangulation-based sensor data. This allows for fusion or further processing of the data for use with a predetermined measurement algorithm to thereby obtain information about the targets.
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