发明授权
- 专利标题： Sensor failure or abnormality detecting system incorporated in a physical or dynamic quantity detecting apparatus
- 专利标题（中）： 传感器故障或异常检测系统结合在物理或动态量检测装置中
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申请号： US09666085申请日： 2000-09-21
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公开(公告)号： US06422088B1公开(公告)日： 2002-07-23
- 发明人: Nobukazu Oba , Yoshifumi Murakami , Yukihiko Tanizawa , Hiroaki Tanaka , Seiichiro Ishio , Inao Toyoda , Yasutoshi Suzuki
- 申请人： Nobukazu Oba , Yoshifumi Murakami , Yukihiko Tanizawa , Hiroaki Tanaka , Seiichiro Ishio , Inao Toyoda , Yasutoshi Suzuki
- 优先权： JP11-270444 19990924; JP11-291241 19991013; JP11-366458 19991224; JP2000-017818 20000121; JP2000-017819 20000121; JP2000-128255 20000427; JP2000-228998 20000728; JP2000-229000 20000728; JP2000-229007 20000728; JP2000-229236 20000728; JP2000-231649 20000731
- 主分类号： G01L900
- IPC分类号： G01L900
摘要：
A reference voltage generating circuit is constituted by resistors RE and RF each having a resistance not influenced by an application of pressure. The reference voltage generating circuit is connected between one and the other ends of a bridge circuit. A failure judgement of the bridge circuit is performed based on a comparison of a voltage difference VBC between two midpoints B and C of the bridge circuit and voltage differences VCE and VBE between a reference voltage level of the reference voltage generating circuit and the voltage levels of two midpoints B and C.
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