发明授权
US06452260B1 Electrical interface to integrated circuit device having high density I/O count 有权
具有高密度I / O计数的集成电路器件的电接口

  • 专利标题: Electrical interface to integrated circuit device having high density I/O count
  • 专利标题(中): 具有高密度I / O计数的集成电路器件的电接口
  • 申请号: US09500118
    申请日: 2000-02-08
  • 公开(公告)号: US06452260B1
    公开(公告)日: 2002-09-17
  • 发明人: Dave B. CorbinEric Bogatin
  • 申请人: Dave B. CorbinEric Bogatin
  • 主分类号: H01L2302
  • IPC分类号: H01L2302
Electrical interface to integrated circuit device having high density I/O count
摘要:
A method of and an apparatus for electrically interconnecting two integrated circuits devices includes mounting the two devices face to face. A first device is mounted for example to a substrate or lead frame. The first device includes a plurality of electrical/physical mounting structures preferably positioned along one edge. The mounting structure provide both electrical interconnection and physical mounting. A second device includes a corresponding plurality of mounting structures configured as a mirror image of the mounting structures on the first device. The mounting structures on the second device are also positioned along one of its edges so that once the mounting structures are brought together in a face to face relationship, the second device cantilevers off the edge of the first device. Under certain circumstances, a dummy block can be mounted to the substrate adjacent to the first device to act as a strut or support for the second device. The mounting structures can be positioned sufficiently close to one another that surface area consumed for I/O is minimized. Another set of electrical interconnect structures can be formed on the surface of the second device on the edge opposite the mounting structures. Electrical connection can be formed to these electrical interconnect structures using conventional techniques such as tape automated bonding.
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