发明授权
US06484282B1 Test pattern generator, a memory testing device, and a method of generating a plurality of test patterns
失效
测试模式发生器，存储器测试装置以及产生多个测试模式的方法
- 专利标题： Test pattern generator, a memory testing device, and a method of generating a plurality of test patterns
- 专利标题（中）： 测试模式发生器，存储器测试装置以及产生多个测试模式的方法
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申请号： US09418758申请日： 1999-10-15
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公开(公告)号： US06484282B1公开(公告)日： 2002-11-19
- 发明人: Masaru Tsuto
- 申请人： Masaru Tsuto
- 优先权： JP10-295157 19981016
- 主分类号： G01R3128
- IPC分类号： G01R3128
摘要：
A test pattern generator for generating a plurality of test patterns to test a memory comprising: a control memory for storing plural kinds of control instructions to generate the test patterns; a vector memory for storing vector instructions indicating an order of the control instructions to be read out from the control memory; a plurality of bank memories for alternately storing vector instructions read out from vector memory and bank memories; an address expander for generating an address of each of control instructions in control memory in accordance with vector instructions stored in a plurality of bank memories; and a test pattern calculator for generating test patterns based on control instructions read out from an address generated by an address expander stored in the control memory.
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