发明授权
US06485654B1 Method of fabricating self-aligned contacts 有权
制造自对准触点的方法

  • 专利标题: Method of fabricating self-aligned contacts
  • 专利标题(中): 制造自对准触点的方法
  • 申请号: US09672548
    申请日: 2000-09-28
  • 公开(公告)号: US06485654B1
    公开(公告)日: 2002-11-26
  • 发明人: Meng-Chang LiuShea-Jue Wang
  • 申请人: Meng-Chang LiuShea-Jue Wang
  • 主分类号: H01L21302
  • IPC分类号: H01L21302
Method of fabricating self-aligned contacts
摘要:
A process for producing a self-aligned contact comprises the steps of forming leads on a substrate, forming an etching stop layer on the leads by depositing, then forming a sacrificed oxide layer; after the structure of the leads is defined, a spacer is formed on both sides of the structure; a sacrificed oxide layer is formed, allowing the spacer to protrude in the form of horn. Next, a dielectric layer having a flat upper surface is deposited on the substrate and the structure of leads, a contact hole being formed between the leads so as to connect the substrate, a conductive material being filled in the contact hole to form a plug.
信息查询
0/0