发明授权
- 专利标题: Electro-optic probe
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申请号: US10080768申请日: 2002-02-22
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公开(公告)号: US06507014B2公开(公告)日: 2003-01-14
- 发明人: Akishige Ito , Katsushi Ohta , Toshiyuki Yagi , Mitsuru Shinagawa , Tadao Nagatsuma , Junzo Yamada
- 申请人: Akishige Ito , Katsushi Ohta , Toshiyuki Yagi , Mitsuru Shinagawa , Tadao Nagatsuma , Junzo Yamada
- 优先权: JP10-294566 19980930
- 主分类号: G01J104
- IPC分类号: G01J104
摘要:
The present invention relates to an electro-optic probe, which includes the following components: a laser diode for emitting a modulating laser light according to control signals generated in a main body of the electro-optic sampling oscilloscope; a first lens for converting the modulating laser light to a parallel beam; a second lens for focusing the parallel beam; an opto-electronic element having a reflection film at a reflection-end; an isolator device disposed between the first lens and the second lens for transmitting the modulating laser light and separating a reflected beam produced at the reflection film into signal beams; and photo-diodes for converting optical energies of the signal beams separated by the isolator device into respective electrical signals; wherein, the signal beams to enter the photo-diodes are directed to propagate towards the laser diode, and the photo-diodes are disposed in a longitudinal direction of a probe casing.
公开/授权文献
- US20020092975A1 Electro-optic probe 公开/授权日:2002-07-18
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