Electro-optical probe for oscilloscope measuring signal waveform
    1.
    发明授权
    Electro-optical probe for oscilloscope measuring signal waveform 失效
    电光探头用于示波器测量信号波形

    公开(公告)号:US06369562B2

    公开(公告)日:2002-04-09

    申请号:US09448525

    申请日:1999-11-23

    IPC分类号: G01R3100

    CPC分类号: G01R13/347

    摘要: An electro-optical probe used for an oscilloscope (e.g., electro-optic sampling oscilloscope) is mainly constructed by a probe head and a probe unit. The probe head contains a metal pin and an electro-optical element having a reflector at its terminal surface. The probe unit contains a reduced number of optical parts, which are arranged such that an optical axis of incoming beams of the electro-optical element differs from a optical axis of outgoing beams of the electro-optical element. That is, laser beams output form a laser diode are subjected to convergence by a converging lens to produce converged beams, which are incident on the electro-optical element as its incoming beams. The incoming beams are subjected to reflection by the reflector to produce reflected beams, which are output from the electro-optical element as its outgoing beams. Then, the reflected beams are converted to parallel beams by a collimator lens, or they are converged by a converging lens. A polarization detector performs separation on input beams from the lens to produce separated components of beams, optical axes of which differ from each other. Those components of beams are respectively supplied to photodiodes, wherein they are converted to electric signals. Thus, it is possible to measure a waveform of a measured signal based on differences between the electric signals, which reflect changes of polarization states of the beams in the electro-optical element.

    摘要翻译: 用于示波器(例如电光采样示波器)的电光探头主要由探头和探头单元构成。 探头包含金属销和在其端子表面具有反射器的电光元件。 探针单元包含减少数量的光学部件,其被布置为使得电光元件的入射光束的光轴与电光元件的输出光束的光轴不同。 也就是说,由激光二极管输出的激光束通过会聚透镜进行会聚,以产生入射到作为入射光束的电光元件上的会聚光束。 入射光束被反射器反射以产生从电光元件作为其输出光束输出的反射光束。 然后,反射光束通过准直透镜转换为平行光束,或者它们被会聚透镜会聚。 偏振检测器执行从透镜的输入光束上的分离,以产生分离的光束分量,光轴彼此不同。 光束的这些分量分别提供给光电二极管,其中它们被转换成电信号。 因此,可以基于反映电光元件中的光束的偏振态的变化的电信号之间的差异来测量测量信号的波形。

    Electro-optic probe
    2.
    发明授权
    Electro-optic probe 失效
    电光探头

    公开(公告)号:US06337565B1

    公开(公告)日:2002-01-08

    申请号:US09520854

    申请日:2000-03-07

    IPC分类号: G01R3100

    CPC分类号: H05K3/1216 G01R1/071

    摘要: An electro-optic probe having a laser diode for generating a laser beam based on a control signal from an oscilloscope body; a collimator lens for making the laser beam into a parallel beam; an electro-optic element having on an end face thereof a reflective coating, with optical characteristics which are changed by propagating an electrical field via a metal pin provided at the end face on the reflective coating side; an isolator provided between the collimator lens and the electro-optic element, which passes a laser beam generated by the laser diode and isolates a reflected beam which is reflected by the reflective coating; and photodiodes which convert the reflected beam isolated by the isolator into electrical signals. The electro-optic element is integrally affixed to a probe head which is rotatable with respect to a probe body on which the probe head is mounted.

    摘要翻译: 一种具有激光二极管的电光探针,用于基于来自示波器主体的控制信号产生激光束; 用于使激光束成平行光束的准直透镜; 电光元件在其端面上具有反射涂层,光学特性通过经由设置在反射涂层侧的端面处的金属销传播电场而改变; 设置在准直透镜和电光元件之间的隔离器,其通过由激光二极管产生的激光束并隔离由反射涂层反射的反射光束; 以及将由隔离器隔离的反射光束转换成电信号的光电二极管。 电光元件整体固定在探针头上,该探针头可相对于其上安装有探头的探针主体旋转。

    Electro-optic probe
    3.
    发明授权
    Electro-optic probe 失效
    电光探头

    公开(公告)号:US06410906B1

    公开(公告)日:2002-06-25

    申请号:US09499944

    申请日:2000-02-08

    IPC分类号: H01J314

    CPC分类号: G01R1/071 G01R13/347

    摘要: An electro-optic probe is provided which is able to prevent unnecessary reflected light from optical components in the electro-optic probe from entering photodiodes. The optical components which constitutes an isolator 13 are disposed inclining from an optical path of a parallel light emitted from a collimating lens 8, such that the unnecessary reflected light beams from these optical component surfaces are not incident to the photodiodes 10 and 11. The inclination angle of these optical components are set within a range from an angle formed by an optical path from said optical component to a light receiving element in said photodiode, and the diameter of said light receiving element to an angle allowable for the optical component to maintain the transmittance thereof.

    摘要翻译: 提供了一种电光探针,其能够防止电光探针中的光学部件的不必要的反射光进入光电二极管。 构成隔离器13的光学部件设置为从准直透镜8发射的平行光的光路倾斜,使得来自这些光学部件表面的不需要的反射光束不入射到光电二极管10和11。倾斜 这些光学部件的角度设定在从由所述光学部件到所述光电二极管中的光接收元件的光路所形成的角度的范围内,并且所述光接收元件的直径保持为允许光学部件保持 透光率。

    Electrooptic probe
    4.
    发明授权
    Electrooptic probe 失效
    电光探头

    公开(公告)号:US06348787B1

    公开(公告)日:2002-02-19

    申请号:US09408753

    申请日:1999-09-30

    IPC分类号: G01R3100

    摘要: A probe for an electrooptic sampling oscilloscope in which an electric field generated by a measured field is coupled with an electrooptic crystal. A beam is incident on this electrooptic crystal, and by the polarization state of the incident beam, the form of the measured signal is measured. The electrooptic element is supported form the end terminal side of the probe body by a probe head member that serves as the end terminal of the probe body. An insertion hole is formed from the outside up to the reflecting film on the probe head member. One end thereof is in contact with a reflecting film, the other end thereof is inserted so as to protrude from the probe head member, and at the same time, the external radial diameter of the insertion hole is formed so as to be large compared to the radial dimension of the reflected film.

    摘要翻译: 用于电光采样示波器的探针,其中由测量场产生的电场与电光晶体耦合。 光束入射在该电光晶体上,并且通过入射光束的偏振状态,测量测量信号的形式。 电光元件通过用作探针主体的端部末端的探针头构件从探针主体的端部末端侧支撑。 从外部到探针头部件上的反射膜形成插入孔。 其一端与反射膜接触,其另一端插入以从探头头部件突出,同时形成插入孔的外径径相对于 反射膜的径向尺寸。

    Electro-optic probe
    5.
    发明授权

    公开(公告)号:US06507014B2

    公开(公告)日:2003-01-14

    申请号:US10080768

    申请日:2002-02-22

    IPC分类号: G01J104

    CPC分类号: G01R1/071

    摘要: The present invention relates to an electro-optic probe, which includes the following components: a laser diode for emitting a modulating laser light according to control signals generated in a main body of the electro-optic sampling oscilloscope; a first lens for converting the modulating laser light to a parallel beam; a second lens for focusing the parallel beam; an opto-electronic element having a reflection film at a reflection-end; an isolator device disposed between the first lens and the second lens for transmitting the modulating laser light and separating a reflected beam produced at the reflection film into signal beams; and photo-diodes for converting optical energies of the signal beams separated by the isolator device into respective electrical signals; wherein, the signal beams to enter the photo-diodes are directed to propagate towards the laser diode, and the photo-diodes are disposed in a longitudinal direction of a probe casing.

    Probe for electro-optic sampling oscilloscope
    6.
    发明授权
    Probe for electro-optic sampling oscilloscope 失效
    电光采样示波器探头

    公开(公告)号:US06288531B1

    公开(公告)日:2001-09-11

    申请号:US09495087

    申请日:2000-01-31

    IPC分类号: G01R3100

    CPC分类号: G01R13/347 G01R1/071

    摘要: An electro-optic probe is provided which is capable of maintaining the contact pressure of the metal pin on the test object at a constant and capable of protecting the safety of the electro-optic element during measurement. The electro-optic probe has a probe head which is attached to the probe body such that a relative position of the probe head in the direction of the optical path can be elastically regulated by a spring disposed between the probe head and the probe body.

    摘要翻译: 提供一种电光探针,其能够将测试对象上的金属针的接触压力保持恒定,并且能够在测量期间保护电光元件的安全性。 电光探头具有探针头,该探针头附接到探针体,使得探针头在光路方向上的相对位置可以通过设置在探针头和探针体之间的弹簧来弹性调节。

    Electro-optic probe
    7.
    发明授权
    Electro-optic probe 失效
    电光探头

    公开(公告)号:US6166845A

    公开(公告)日:2000-12-26

    申请号:US317917

    申请日:1999-05-25

    CPC分类号: G01R1/071 G01R13/347

    摘要: The present invention relates to a probe for an electro-optic sampling oscillator.The probe for an electro-optic sampling oscillator provides a laser diode that generates a laser beam based on the control signal of the electro-optical sampling oscilloscope; a collimator lens that makes the laser beam into a parallel beam; an electro-optic element that has a reflecting film at the end; an isolator provided between the collimator lens and the electro-optic element that passes the laser beam that is generated by the laser diode and separates the reflected beam of the laser beam that was reflected by the reflecting film; photodiodes that convert the reflected beam separated by the isolator into an electrical signal; and a condenser lens provided between the isolator and the electro-optic element that condenses the parallel beam to one point on the reflecting film, makes the reflected beam reflected by the reflecting film into a parallel beam again, and makes the optical axes of the light incident on the reflecting film and the light reflected by the reflecting film coincide.

    摘要翻译: 本发明涉及一种用于电光采样振荡器的探针。 用于电光采样振荡器的探针提供基于电光采样示波器的控制信号产生激光束的激光二极管; 使激光束成平行光束的准直透镜; 电光元件,其末端具有反射膜; 设置在准直透镜和电光元件之间的隔离器,其通过由激光二极管产生的激光束并分离由反射膜反射的激光束的反射光束; 将由隔离器分离的反射光束转换为电信号的光电二极管; 并且设置在隔离器和电光元件之间的聚光透镜,其将平行光束会聚到反射膜上的一个点,使得由反射膜反射的反射光束再次成为平行光束,并使光的光轴 入射到反射膜上并且由反射膜反射的光重合。

    Probe for electro-optic sampling oscilloscope
    9.
    发明授权
    Probe for electro-optic sampling oscilloscope 失效
    电光采样示波器探头

    公开(公告)号:US06407561B1

    公开(公告)日:2002-06-18

    申请号:US09578963

    申请日:2000-05-25

    IPC分类号: G01R31308

    CPC分类号: G01R1/071

    摘要: A probe for an electro-optic sampling oscilloscope is provided, capable of obtaining an improved accuracy in measurement of the test measuring signals by controlling a temperature of an electro-optic element so as to be maintained at a constant such that the refractive index of the electro-optic element does not change due to the temperature change. The probe for the electro-optic sampling oscilloscope comprises a reflecting film at one end and a metal pin provided on the surface of the reflecting film such that the optical property of the electro-optic film changes according to an electric field applied through the metal pin. The probe further comprises a temperature detecting portion, disposed so as to contact with the electro-optic element, for detecting and outputting the temperature of the electro-optic element, a temperature adjusting portion, disposed so as to contact with the electro-optic element facing the temperature detecting portion about the electro-optic element, and a temperature controlling portion for controlling the temperature adjusting portion based on the result of the temperature detection.

    摘要翻译: 提供了一种用于电光采样示波器的探针,其能够通过控制电光元件的温度来获得测试测量信号的测量精度,从而保持恒定,使得 电光元件不会因温度变化而变化。 用于电光取样示波器的探针包括一端的反射膜和设置在反射膜的表面上的金属针,使得电光膜的光学特性根据通过金属引脚施加的电场而改变 。 探头还包括设置成与电光元件接触的温度检测部分,用于检测和输出电光元件的温度,温度调节部分,设置成与电光元件接触 面对围绕电光元件的温度检测部分,以及温度控制部分,用于基于温度检测的结果来控制温度调节部分。

    Electrooptic probe
    10.
    发明授权
    Electrooptic probe 失效
    电光探头

    公开(公告)号:US06297650B1

    公开(公告)日:2001-10-02

    申请号:US09374503

    申请日:1999-08-16

    IPC分类号: G01R31308

    CPC分类号: G01R1/071

    摘要: The present invention relates to an electrooptic probe that couples an electrical field generated by a measured signal and an electrooptic crystal, makes light incident on this electrooptic crystal, and measures the waveform of the measured signal by the state of the polarization of the incident light. Here, in the probe body 22, the probe head 23 and the supporting member 44 positioned between the end terminal 22a and the part that encloses the laser diode 25 and the photodiodes 38 and 39 are formed by an insulating body (polyacetal resin). Furthermore, the photodiodes 38 and 39 and the laser diode 25 are covered by electromagnetic shield members 41 and 42 that are separated from each other.

    摘要翻译: 本发明涉及一种电光探头,其将由测量信号产生的电场与电光晶体相耦合,使光入射到该电光晶体上,并通过入射光的偏振状态来测量测量信号的波形。 这里,在探针体22中,位于端子端子22a与包围激光二极管25的部分和光电二极管38,39之间的探针头23和支撑构件44由绝缘体(聚缩醛树脂)形成。 此外,光电二极管38和39以及激光二极管25被彼此分离的电磁屏蔽构件41和42覆盖。