- 专利标题: System for providing electrostatic discharge protection for high-speed integrated circuits
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申请号: US10072191申请日: 2002-02-07
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公开(公告)号: US06509779B2公开(公告)日: 2003-01-21
- 发明人: Chik Patrick Yue , Siu-Weng Simon Wong , David Kuochieh Su , William John McFarland
- 申请人: Chik Patrick Yue , Siu-Weng Simon Wong , David Kuochieh Su , William John McFarland
- 主分类号: H03K508
- IPC分类号: H03K508
摘要:
An ESD protection circuit uses an inductor to create an electromagnetic resonance in conjunction with the load capacitance of a conventional ESD device. By properly tuning the resonance of this combination, the protective properties of the ESD device can be maintained while minimizing its capacitive load on the main circuit. The inductor can be interposed in various series configurations with the ESD device between the main circuit and a voltage rail; alternatively, the inductor can be connected in various configurations in parallel with the ESD device. The inductor may be implemented as an on-chip inductor using conventional IC fabrication technologies, or may be implemented using IC chip bonding wires as inductors.
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