A method for electrically coupling electrode pads comprising forming a reflowed solder bump on a first electrode pad supported by a first substrate. The reflowed solder bump includes a solder material having a solder melting temperature. The method further includes forming a second electrode pad on a second substrate. The second electrode pad has an electrode structure defined by at least one converging continuous arcuate surface terminating in an apex and having an electrode material whose melting temperature is greater than the solder melting temperature of the solder material. The solder bump is heated to reflow or to soften the solder material, and subsequently the apex of the second electrode pad is pressed or inserted into the heated solder bump to couple the first electrode pad to the second electrode pad. A method for solder bump reflow comprising pressing or inserting the apex of an electrode into a reflowed solder bumps, and then reflowing solder material of the reflowed solder bump. A semiconductor assembly including a semiconductor device having an electrode pad coupled to a semiconductor substrate and comprising an electrode structure defined by a pair of arcuate surfaces generally tangentially terminating in an apex.