发明授权
- 专利标题: Method for producing semiconductor device
- 专利标题(中): 半导体器件的制造方法
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申请号: US09717142申请日: 2000-11-22
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公开(公告)号: US06544826B1公开(公告)日: 2003-04-08
- 发明人: Shunpei Yamazaki , Hisashi Ohtani , Hideto Ohnuma
- 申请人: Shunpei Yamazaki , Hisashi Ohtani , Hideto Ohnuma
- 优先权: JP9-176353 19970617
- 主分类号: H01L2100
- IPC分类号: H01L2100
摘要:
In producing TFT by crystallizing an amorphous silicon film by the action of nickel, the influence of nickel on the TFT produced is inhibited. A mask 104 is formed over an amorphous silicon film 102, and a nickel-containing solution is applied thereover. In that condition, nickel is kept in contact with the surface of the amorphous silicon film at the opening 103 of the mask. Then, this is heated to crystallize the amorphous silicon film. Next, a phosphorus-containing solution is applied thereto, so that phosphorus is introduced into the silicon film in the region of the opening 103. This is again heated, whereby nickel is gettered in the region into which phosphorus has been introduced. In this process, the nickel concentration in the silicon film is reduced.
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