Invention Grant
- Patent Title: Autoadjusting charged-particle probe-forming apparatus
- Patent Title (中): 自动调整带电粒子探针形成装置
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Application No.: US09686805Application Date: 2000-10-12
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Publication No.: US06552340B1Publication Date: 2003-04-22
- Inventor: Ondrej L. Krivanek , Niklas Dellby , Andrew R. Lupini
- Applicant: Ondrej L. Krivanek , Niklas Dellby , Andrew R. Lupini
- Main IPC: H01J3721
- IPC: H01J3721

Abstract:
An autoadjusting charged-particle probe-forming apparatus improving the resolution of probe-forming charged-particle optical systems by minimizing optical aberrations. The apparatus comprises a source of charged particles, a probe-forming system of charged-particle lenses, a plurality of detectors optionally comprising a two-dimensional image detector, power supplies, a computer and appropriate software. Images are recorded by the two-dimensional detector and analyzed to determine the aberration characteristics of the apparatus. Alternately, multiple scanned images are recorded by a scanned image detector and also analyzed to determine the aberration characteristics of the apparatus. The aberration characteristics are used to automatically adjust the apparatus for improved optical performance.
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