发明授权
- 专利标题: Process for the fabrication of wiring board for electrical tests
- 专利标题(中): 制造用于电气测试的接线板的工艺
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申请号: US09036494申请日: 1998-03-06
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公开(公告)号: US06568073B1公开(公告)日: 2003-05-27
- 发明人: Naoki Fukutomi , Hidehiro Nakamura , Hajime Nakayama , Yoshiaki Tsubomatsu , Masanori Nakamura , Kouichi Kaitou , Atsushi Kuwano , Itsuo Watanabe , Masahiko Itabashi
- 申请人: Naoki Fukutomi , Hidehiro Nakamura , Hajime Nakayama , Yoshiaki Tsubomatsu , Masanori Nakamura , Kouichi Kaitou , Atsushi Kuwano , Itsuo Watanabe , Masahiko Itabashi
- 优先权: JP3-316252 19911129; JP4-104675 19920423; JP5-99954 19930427; JP9-333201 19931227
- 主分类号: H05K310
- IPC分类号: H05K310
摘要:
The present invention provides a process for the fabrication of a wiring board, which comprises the following steps: (a) forming a first wiring pattern on a first side of a self-supporting carrier metal foil so as to obtain a self-supporting wiring sheet comprising the carrier metal foil and the first wiring pattern; (b) superposing and pressing the first side of said self-supporting wiring sheet on and against an insulating substrate so that the first wiring pattern is_embedded in the insulating substrate and constitutes a surface with the insulating substrate; and (c) etching off desired portions of said carrier metal foil to form a second wiring pattern made of said carrier metal foil remaining on the surface constituted by the insulating substrate and the first wiring pattern. The present invention also provides the wiring board for electrical tests so fabricated.
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