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US06570800B2 High speed clock synchronous semiconductor memory in which the column address strobe signal is varied in accordance with a clock signal 失效
高速时钟同步半导体存储器,其中列地址选通信号根据时钟信号而变化

High speed clock synchronous semiconductor memory in which the column address strobe signal is varied in accordance with a clock signal
摘要:
The column address strobe signal (CAS) which is changed in cycles as many as a plurality of times that of a clock signal cycle is input to the memory block (MBK0 to MBKn). A plurality of serial data readout from the memory cell array (10) and parallel/serial converted by a parallel/serial converter circuit (21) in synchronism with a clock signal cycle are output for every cycle when the column address signal (CASADR) is changed. Parallel data input to the memory block and serial/parallel converted by a serial/parallel converter circuit (25) in synchronism with the clock signal cycle are written in the memory cell array. In this way, the access specification that the column address strobe signal is varied once per n cycles of the clock signal allows for a more rapid memory operation.
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