发明授权
- 专利标题: Contact structure and production method thereof and probe contact assembly using same
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申请号: US09954333申请日: 2001-09-12
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公开(公告)号: US06608385B2公开(公告)日: 2003-08-19
- 发明人: Yu Zhou , David Yu , Robert Edward Aldaz , Theodore A. Khoury
- 申请人: Yu Zhou , David Yu , Robert Edward Aldaz , Theodore A. Khoury
- 主分类号: H01L2348
- IPC分类号: H01L2348
摘要:
A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contactor carrier and a plurality of contactors. The contactor has an upper end oriented in a vertical direction, a straight beam portion oriented in a direction opposite to the upper end and having a lower end which functions as a contact point for electrical connection with a contact target, a return portion returned from the lower end and running in parallel with the straight beam portion to create a predetermined gap therebetween, a diagonal beam portion provided between the upper end and the straight beam portion to function as a spring.
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