利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

21 条记录 (耗时 0.021 秒)

    Thermal controller for electronic devices
    4.
    发明授权
    Thermal controller for electronic devices 有权
    电子设备热控制器

    公开(公告)号：US08896335B2

    公开(公告)日：2014-11-25

    申请号：US12278841

    申请日：2007-07-30

    申请人： Larry Stuckey ,  Anastasios Golnas ,  Robert Edward Aldaz ,  David Yu

    发明人： Larry Stuckey ,  Anastasios Golnas ,  Robert Edward Aldaz ,  David Yu

    IPC分类号： F25B29/00 ,  H01L23/473

    CPC分类号： H01L23/4735 ,  H01L2924/0002 ,  H01L2924/00

    摘要： An apparatus controls a temperature of a device by circulating a fluid through a heat sink in thermal contact with the device. The apparatus includes an adjustable cold input, which inputs a cold portion of the fluid having a first temperature, and an adjustable hot input, which inputs a hot portion of the fluid having a second temperature higher than the first temperature. The apparatus further includes a chamber, connected to the cold input and hot input, in which the cold and hot portions of the fluid mix in a combined fluid portion that impinges on the heat sink. The combined fluid portion has a combined temperature that directly affects a temperature of the heat sink. The cold input and hot input are adjusted to dynamically control the combined temperature, enabling the heat sink temperature to compensate for changes in the device temperature, substantially maintaining a set point temperature of the device.

    摘要翻译： 一种装置通过使流体通过与装置热接触的散热器循环来控制装置的温度。 该装置包括可调冷输入，其输入具有第一温度的流体的冷部分和可调节的热输入，其输入具有高于第一温度的第二温度的流体的热部分。 该装置还包括连接到冷输入和热输入的室，其中流体的冷和热部分在撞击散热器的组合流体部分中混合。 组合的流体部分具有直接影响散热器的温度的组合温度。 冷输入和热输入被调整以动态地控制组合温度，使得散热器温度能够补偿器件温度的变化，从而基本保持器件的设定点温度。

    Probe contact system having planarity adjustment mechanism
    5.
    发明授权
    Probe contact system having planarity adjustment mechanism 失效
    具有平面度调节机构的探头接触系统

    公开(公告)号：US06762612B2

    公开(公告)日：2004-07-13

    申请号：US10233935

    申请日：2002-09-03

    申请人： David Yu ,  Yu Zhou ,  Robert Edward Aldaz

    发明人： David Yu ,  Yu Zhou ,  Robert Edward Aldaz

    IPC分类号： G01R3102

    CPC分类号： G01R1/07314 ,  G01R1/07342

    摘要： A probe contact system is capable of adjusting distances between tips of the contactors and contact targets with simple and low cost mechanism. The probe contact system includes a contact substrate having a large number of contactors, a probe card for fixedly mounting the contact substrate for establishing electrical communication between the contactors and a test system, a stiffener made of rigid material for fixedly mounting and reinforcing the probe card, a probe card ring attached to a frame of the probe contact system for mechanically coupling the probe card to the frame, and a plurality of adjustment members for up/down moving the stiffener relative to the probe card ring at three or more locations so that a gap between the probe card and the probe card ring can be altered.

    摘要翻译： 探头接触系统能够以简单且低成本的机制调节接触器的尖端和接触目标之间的距离。 探针接触系统包括具有大量接触器的接触基板，用于固定地安装用于建立接触器和测试系统之间的电气连接的接触基板的探针卡，用于固定地安装和加强探针卡的刚性材料制成的加强件 附接到探针接触系统的框架的探针卡环，用于将探针卡机械地耦合到框架;以及多个调节构件，用于在三个或更多个位置上使加强件相对于探针卡环上下移动，使得 可以改变探针卡和探针卡环之间的间隙。

    Probe contract system having planarity adjustment mechanism
    7.
    发明授权
    Probe contract system having planarity adjustment mechanism 失效
    具有平面调整机制的探头契约系统

    公开(公告)号：US06586956B2

    公开(公告)日：2003-07-01

    申请号：US09885437

    申请日：2001-06-20

    申请人： Robert Edward Aldaz ,  Theodore A. Khoury

    发明人： Robert Edward Aldaz ,  Theodore A. Khoury

    IPC分类号： G01R3102

    CPC分类号： G01R1/07342 ,  G01R1/06794 ,  G01R1/07378

    摘要： A probe contact system is capable of adjusting distances between tips of the contactors and contact targets with simple and low cost mechanism. The probe contact system includes a contact substrate having a plurality of contactors thereon, a probe card for fixedly mounting the contact substrate, a conductive elastomer provided between the contact substrate and the probe card, a gap sensor for measuring a distance between the contact substrate and the contact targets, a probe card ring attached to a frame of the probe contact system for mechanically coupling the probe card to the frame, and a plurality of connection members for connecting the probe card to the probe card ring while adjusting a gap between the probe card and the probe card ring.

    摘要翻译： 探头接触系统能够以简单且低成本的机制调节接触器的尖端和接触目标之间的距离。 探针接触系统包括其上具有多个接触器的接触衬底，用于固定安装接触衬底的探针卡，设置在接触衬底和探针卡之间的导电弹性体，用于测量接触衬底和接触衬底之间的距离的间隙传感器 接触目标，附接到用于将探针卡机械地耦合到框架的探针接触系统的框架的探针卡环以及用于将探针卡连接到探针卡环的多个连接构件，同时调节探针之间的间隙 卡和探针卡环。

    Probe contact system having planarity adjustment mechanism
    10.
    发明授权
    Probe contact system having planarity adjustment mechanism 失效
    具有平面度调节机构的探头接触系统

    公开(公告)号：US06441629B1

    公开(公告)日：2002-08-27

    申请号：US09583837

    申请日：2000-05-31

    申请人： Theodore A. Khoury ,  Robert Edward Aldaz

    发明人： Theodore A. Khoury ,  Robert Edward Aldaz

    IPC分类号： G01R3102

    CPC分类号： G01R1/07342 ,  G01R1/06794 ,  G01R1/07378

    摘要： A probe contact system is capable of adjusting distances between tips of the contactors and contact targets with simple and low cost mechanism. The planarity adjustment mechanism includes a contact substrate having a plurality of contactors mounted on a surface thereof, a probe card for establishing electrical communication between the contactors and a semiconductor test system, a conductive elastomer provided between the contact substrate and the probe card, connection members for connecting the contact substrate and the probe card at three locations on the contact substrate where each of the connection members is adjustable for changing a distance between the contact substrate and the probe card, a gap sensor for measuring a gap between the contact substrate and a semiconductor wafer, and a rotation adjustment device for rotating the connection member.

    摘要翻译： 探头接触系统能够以简单且低成本的机制调节接触器的尖端和接触目标之间的距离。 平面度调整机构包括具有安装在其表面上的多个接触器的接触基板，用于建立接触器与半导体测试系统之间的电连通的探针卡，设置在接触基板和探针卡之间的导电弹性体，连接构件 用于在接触基板上的三个位置处连接接触基板和探针卡，其中每个连接构件可调整以改变接触基板和探针卡之间的距离;间隙传感器，用于测量接触基板和接触基板之间的间隙 半导体晶片和旋转调整装置，用于旋转连接构件。