发明授权
- 专利标题： Orthogonal ion sampling for APCI mass spectrometry
- 专利标题（中）： APCI质谱的正交离子采样
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申请号： US10265943申请日： 2002-10-07
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公开(公告)号： US06639216B2公开(公告)日： 2003-10-28
- 发明人: James A. Apffel, Jr. , Mark H. Werlich , James L. Bertsch , Paul C. Goodley , Kent D. Henry
- 申请人： James A. Apffel, Jr. , Mark H. Werlich , James L. Bertsch , Paul C. Goodley , Kent D. Henry
- 主分类号： H01J4926
- IPC分类号： H01J4926
摘要：
A method and apparatus are disclosed wherein a plurality of electric fields and of orthogonal spray configurations of vaporized analyte are so combined as to enhance the efficiency of analyte detection and mass analysis. The invention provides reduced noise and increased signal sensitivity in both API electrospray and APCI operating modes.
公开/授权文献
- US20030075680A1 Orthogonal ion sampling for APCI mass spectrometry 公开/授权日：2003-04-24