发明授权
- 专利标题: Optical module testing system
- 专利标题(中): 光模块测试系统
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申请号: US09758772申请日: 2001-01-11
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公开(公告)号: US06676304B1公开(公告)日: 2004-01-13
- 发明人: Bryan Coin , Michael J. Ransford , David A. Schwarten , Chao Jiang , Iqbal M. Dar , Andrei Csipkes
- 申请人: Bryan Coin , Michael J. Ransford , David A. Schwarten , Chao Jiang , Iqbal M. Dar , Andrei Csipkes
- 主分类号: G01N2100
- IPC分类号: G01N2100
摘要:
A system for conducting optical tests on a plurality of optical modules includes a plurality of optical signal sources and optical signal degradation elements optically communicating with input switches. The input switches sources supply optical test signals to optical modules (units under test) plugged into a common shelf. Output optical switches supply the output signals to a range of optical test equipment. A controller utilizes a database of test recipes to supervise and control the optical signal sources, optical signal degradation elements, units under test, input switches, output switches, and test equipment to conduct a variety of optical tests on the modules. With this architecture it is possible to subject a variety of different optical modules to a variety of different optical tests.
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