Invention Grant
- Patent Title: Apparatus for and method of measuring a jitter
- Patent Title (中): 用于测量抖动的装置和方法
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Application No.: US09408280Application Date: 1999-09-29
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Publication No.: US06687629B1Publication Date: 2004-02-03
- Inventor: Takahiro Yamaguchi , Mani Soma , Masahiro Ishida , Yasuo Furukawa , Toshifumi Watanabe
- Applicant: Takahiro Yamaguchi , Mani Soma , Masahiro Ishida , Yasuo Furukawa , Toshifumi Watanabe
- Main IPC: G01R2926
- IPC: G01R2926

Abstract:
A clock waveform XC(t) is transformed into a complex analytic signal using a Hilbert transformer and an instantaneous phase of this analytic signal is estimated. A linear phase is subtracted from the instantaneous phase to obtain a varying term &Dgr;&phgr;(t). A difference between the maximum value and the minimum value of the varying term &Dgr;&phgr;(t) is obtained as a peak-to-peak jitter, and a root-mean-square of the varying term &Dgr;&phgr;(t) is calculated to obtain an RMS jitter.
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