发明授权
- 专利标题: Method for manufacturing a semiconductor device using recirculation of a process gas
- 专利标题(中): 使用工艺气体再循环来制造半导体器件的方法
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申请号: US09955083申请日: 2001-09-19
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公开(公告)号: US06689699B2公开(公告)日: 2004-02-10
- 发明人: Itsuko Sakai , Takayuki Sakai , Tokuhisa Ohiwa
- 申请人: Itsuko Sakai , Takayuki Sakai , Tokuhisa Ohiwa
- 优先权: JP2000-287716 20000921; JP2001-012257 20010119
- 主分类号: H01L2100
- IPC分类号: H01L2100
摘要:
There is disclosed a semiconductor processing apparatus comprising a process chamber treating a substrate, a process gas feeder feeding a process gas to the process chamber, a first vacuum pump exhausting the process chamber, a second vacuum pump inhaling gas on an exhaust side of the first vacuum pump, and a circulation path circulating at least a part of the process gas exhausted from the process chamber via the first vacuum pump into the process chamber, wherein the circulation path is provided with a dust trapping mechanism, the dust trapping mechanism being capable of substantially maintaining a conductance of the circulation path before and after the capture of dust.
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