Invention Grant
- Patent Title: Pulsed eddy current two-dimensional sensor array inspection probe and system
- Patent Title (中): 脉冲涡流二维传感器阵列检测探头和系统
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Application No.: US09681824Application Date: 2001-06-12
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Publication No.: US06720775B2Publication Date: 2004-04-13
- Inventor: Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , Curtis Wayne Rose , Thomas James Batzinger , Kenneth Gordon Herd
- Applicant: Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , Curtis Wayne Rose , Thomas James Batzinger , Kenneth Gordon Herd
- Main IPC: G01R3128
- IPC: G01R3128

Abstract:
A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.
Public/Granted literature
- US20020190724A1 Pulsed eddy current two-dimensional sensor array inspection probe and system Public/Granted day:2002-12-19
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