A technique for reducing the read gate voltage in a memory array including memory cells having a transistor for storing charge indicative of the value stored in the cell. In one example, a voltage greater than the substrate voltage is applied to the sources of the transistors of the memory cells of the array to increase the threshold voltage of a transistor due the body effect. The read gate voltage is greater than the source voltage which is greater than the substrate voltage. A non read voltage of less than the source voltage is applied to the gates of the transistors of the unselected rows to reduce leakage current. With this embodiment, the threshold voltages of transistors having an erased state can be less than 0V. With some embodiments, the read disturb caused by a gate voltage can be reduced due to the reduction in the gate voltage. In other examples, a negative voltage is applied to the gates of unselected rows to prevent leakage current. Accordingly, the voltage thresholds of transistors having an erased state can be reduced, wherein the read gate voltage can be reduced as well.