发明授权
US06765414B2 Low frequency testing, leakage control, and burn-in control for high-performance digital circuits
有权
用于高性能数字电路的低频测试，泄漏控制和老化控制
- 专利标题： Low frequency testing, leakage control, and burn-in control for high-performance digital circuits
- 专利标题（中）： 用于高性能数字电路的低频测试，泄漏控制和老化控制
-
申请号： US10246377申请日： 2002-09-17
-
公开(公告)号： US06765414B2公开(公告)日： 2004-07-20
- 发明人: Ali Keshavarzi , Bhaskar P. Chatterjee , Ram Krishnamurthy , Manoj Sachdev
- 申请人： Ali Keshavarzi , Bhaskar P. Chatterjee , Ram Krishnamurthy , Manoj Sachdev
- 主分类号： H03K19096
- IPC分类号： H03K19096
摘要：
A technique is described to allow testing of high-speed digital circuits using lower speed testing equipment, to circuits to be placed into a sleep mode, and to allow burn-in testing of digital circuits with minimal overhead in terms of silicon area or performance.
公开/授权文献
信息查询
