发明授权
US06765667B2 Method for inspection of circuit boards and apparatus for inspection of circuit boards 失效
电路板检查方法和电路板检查装置

  • 专利标题: Method for inspection of circuit boards and apparatus for inspection of circuit boards
  • 专利标题(中): 电路板检查方法和电路板检查装置
  • 申请号: US09916181
    申请日: 2001-07-26
  • 公开(公告)号: US06765667B2
    公开(公告)日: 2004-07-20
  • 发明人: Noboru HigashiDaisuke NagaiKenichi Kaida
  • 申请人: Noboru HigashiDaisuke NagaiKenichi Kaida
  • 优先权: JP2000-227790 20000727
  • 主分类号: G01N2100
  • IPC分类号: G01N2100
Method for inspection of circuit boards and apparatus for inspection of circuit boards
摘要:
A method for inspection of circuit boards is described which includes: a process of measuring surface-shape data of a circuit board on which inspection objects are placed; an approximated curved surface generation process for generating an approximated curved surface from the measured surface-shape data, which is an estimated surface-shape of the circuit board, on which no inspection object is placed; a process of subtracting said approximated curved surface from the measured surface-shape data; a region of interest determination process of determining regions which are different from the approximated curved surface in accordance with data obtained by said subtraction process; and a process of inspecting whether electronic parts placed on said circuit board and connecting materials for connecting the electronic parts are in a desired state or not.
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