发明授权
- 专利标题: Method for inspection of circuit boards and apparatus for inspection of circuit boards
- 专利标题(中): 电路板检查方法和电路板检查装置
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申请号: US09916181申请日: 2001-07-26
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公开(公告)号: US06765667B2公开(公告)日: 2004-07-20
- 发明人: Noboru Higashi , Daisuke Nagai , Kenichi Kaida
- 申请人: Noboru Higashi , Daisuke Nagai , Kenichi Kaida
- 优先权: JP2000-227790 20000727
- 主分类号: G01N2100
- IPC分类号: G01N2100
摘要:
A method for inspection of circuit boards is described which includes: a process of measuring surface-shape data of a circuit board on which inspection objects are placed; an approximated curved surface generation process for generating an approximated curved surface from the measured surface-shape data, which is an estimated surface-shape of the circuit board, on which no inspection object is placed; a process of subtracting said approximated curved surface from the measured surface-shape data; a region of interest determination process of determining regions which are different from the approximated curved surface in accordance with data obtained by said subtraction process; and a process of inspecting whether electronic parts placed on said circuit board and connecting materials for connecting the electronic parts are in a desired state or not.
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