Invention Grant
- Patent Title: Floating gate and method of fabricating the same
- Patent Title (中): 浮门及其制造方法
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Application No.: US10436800Application Date: 2003-05-13
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Publication No.: US06770520B2Publication Date: 2004-08-03
- Inventor: Ying-Cheng Chuang , Chung-Lin Huang , Chi-Hui Lin
- Applicant: Ying-Cheng Chuang , Chung-Lin Huang , Chi-Hui Lin
- Priority: TW91118388A 20020815
- Main IPC: H01L21337
- IPC: H01L21337

Abstract:
A floating gate and fabrication method thereof. A semiconductor substrate is provided, on which a gate dielectric layer, a conducting layer, and a patterned hard mask layer are sequentially formed. The surface of the conducting layer is covered by the patterned hard mask layer to form a gate. The conducting layer is etched to a predetermined depth to form an indentation using the patterned hard mask layer as a mask. The conducting layer is oxidized to form an oxide layer on the surface of the conducting layer. The oxide layer and the conducting layer are etched to form multiple tips using the patterned hard mask layer as a mask.
Public/Granted literature
- US20040033655A1 Floating gate and method of fabricating the same Public/Granted day:2004-02-19
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