发明授权
US06780498B2 Silicon-based composition, low dielectric constant film, semiconductor device, and method for producing low dielectric constant film 有权
硅类组合物,低介电常数膜,半导体器件以及低介电常数膜的制造方法

  • 专利标题: Silicon-based composition, low dielectric constant film, semiconductor device, and method for producing low dielectric constant film
  • 专利标题(中): 硅类组合物,低介电常数膜,半导体器件以及低介电常数膜的制造方法
  • 申请号: US09983951
    申请日: 2001-10-26
  • 公开(公告)号: US06780498B2
    公开(公告)日: 2004-08-24
  • 发明人: Yoshihiro NakataKatsumi SuzukiIwao SugiuraEi Yano
  • 申请人: Yoshihiro NakataKatsumi SuzukiIwao SugiuraEi Yano
  • 优先权: JP2001-084475 20010323
  • 主分类号: B32B326
  • IPC分类号: B32B326
Silicon-based composition, low dielectric constant film, semiconductor device, and method for producing low dielectric constant film
摘要:
A composition comprising a siloxane resin, a silicon compound substantially consisting of silicon, carbon and hydrogen, wherein the number ratio of carbon to silicon atoms forming an —X— bond (wherein X is (C)m (where m is an integer in the range of from 1 to 3), or a substituted or unsubstituted aromatic group with 9 or less carbon atoms) in the main chain of one molecule is in the range of from 2:1 to 12:1, and a solvent, is subjected to a heat treatment to form a low dielectric constant film. Accordingly, a low dielectric constant film having excellent resistance against chemicals and excellent moisture resistance is provided. A semiconductor integrated circuit having a fast response can be produced by using the film.
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