发明授权
- 专利标题: Jitter measuring device and method
- 专利标题(中): 抖动测量装置及方法
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申请号: US09647908申请日: 2000-10-05
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公开(公告)号: US06795496B1公开(公告)日: 2004-09-21
- 发明人: Mani Soma , Takahiro Yamaguchi , Masahiro Ishida , Yasuo Furukawa , Toshifumi Watanabe
- 申请人: Mani Soma , Takahiro Yamaguchi , Masahiro Ishida , Yasuo Furukawa , Toshifumi Watanabe
- 主分类号: H04B346
- IPC分类号: H04B346
摘要:
A signal under measurement is transformed into a complex analytic signal using a Hilbert transformer and an instantaneous phase of this analytic signal is estimated. A linear phase is subtracted from the instantaneous phase to obtain a phase noise waveform. The phase noise waveform is sampled in the proximity of a zero crossing point of a real part of the analytic signal. A differential waveform of the sample phase noise waveform is calculated to obtain a differential phase noise waveform. An RMS jitter is obtained from the phase noise waveform, and a peak-to-peak jitter is obtained from the phase noise waveform.