Invention Grant
- Patent Title: Dimension-measuring column and method for entering a command to switch the measure mode in such a column
- Patent Title (中): 尺寸测量列和输入命令以在此列中切换测量模式的方法
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Application No.: US09996115Application Date: 2001-11-28
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Publication No.: US06802133B2Publication Date: 2004-10-12
- Inventor: Pascal Jordil , Charles-Henri Zufferey
- Applicant: Pascal Jordil , Charles-Henri Zufferey
- Priority: EP01810258 20010314
- Main IPC: G01B500
- IPC: G01B500

Abstract:
Method enabling a command to switch the measure mode to be entered in a single vertical axis dimension-measuring column. The mode witch command is entered by pressing the probe tip against the piece to be measured during a time interval greater than a predetermined value. The measuring and displaying system then engages in a search mode of the turn-back point of said piece to be measured. Application: measurement of inner or outer diameters by means of a single-axis measuring column. The method allows the hole's minimal and maximal points to be determined with a minimum of handling operations.
Public/Granted literature
- US20020133311A1 Dimension-measuring column and method for entering a command to switch the measure mode in such a column Public/Granted day:2002-09-19
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