Invention Grant
US06802133B2 Dimension-measuring column and method for entering a command to switch the measure mode in such a column 有权
尺寸测量列和输入命令以在此列中切换测量模式的方法

  • Patent Title: Dimension-measuring column and method for entering a command to switch the measure mode in such a column
  • Patent Title (中): 尺寸测量列和输入命令以在此列中切换测量模式的方法
  • Application No.: US09996115
    Application Date: 2001-11-28
  • Publication No.: US06802133B2
    Publication Date: 2004-10-12
  • Inventor: Pascal JordilCharles-Henri Zufferey
  • Applicant: Pascal JordilCharles-Henri Zufferey
  • Priority: EP01810258 20010314
  • Main IPC: G01B500
  • IPC: G01B500
Dimension-measuring column and method for entering a command to switch the measure mode in such a column
Abstract:
Method enabling a command to switch the measure mode to be entered in a single vertical axis dimension-measuring column. The mode witch command is entered by pressing the probe tip against the piece to be measured during a time interval greater than a predetermined value. The measuring and displaying system then engages in a search mode of the turn-back point of said piece to be measured. Application: measurement of inner or outer diameters by means of a single-axis measuring column. The method allows the hole's minimal and maximal points to be determined with a minimum of handling operations.
Information query
Patent Agency Ranking
0/0