发明授权
US06839873B1 Method and apparatus for programmable logic device (PLD) built-in-self-test (BIST)
有权
可编程逻辑器件（PLD）内置自检（BIST）的方法和装置
- 专利标题： Method and apparatus for programmable logic device (PLD) built-in-self-test (BIST)
- 专利标题（中）： 可编程逻辑器件（PLD）内置自检（BIST）的方法和装置
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申请号： US09602938申请日： 2000-06-23
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公开(公告)号： US06839873B1公开(公告)日： 2005-01-04
- 发明人: Michael T. Moore
- 申请人： Michael T. Moore
- 申请人地址： US CA San Jose
- 专利权人： Cypress Semiconductor Corporation
- 当前专利权人： Cypress Semiconductor Corporation
- 当前专利权人地址： US CA San Jose
- 代理商 Bradley T. Sako
- 主分类号： G01R31/317
- IPC分类号： G01R31/317 ; G01R31/3185 ; G01R31/28
摘要：
According to one embodiment, a programmable logic assembly (200) may include a nonvolatile memory (202) may be coupled to an associated volatile programmable logic device (PLD) (204). Built-in-self-test (BIST) data (208) may be stored in a nonvolatile memory (202) that places the volatile PLD (204) in a self-test configuration. If a volatile PLD (204) passes a self-test, user data (210) may be stored in a nonvolatile memory (202) that places a volatile PLD (204) into a user determined configuration.
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