发明授权
- 专利标题: Measuring absolute static pressure at one or more positions along a microfluidic device
- 专利标题(中): 在微流体装置的一个或多个位置测量绝对静压
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申请号: US10647360申请日: 2003-08-25
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公开(公告)号: US06843121B1公开(公告)日: 2005-01-18
- 发明人: Michael J. DeBar , Zhihao Yang
- 申请人: Michael J. DeBar , Zhihao Yang
- 申请人地址: US NY Rochester
- 专利权人: Eastman Kodak Company
- 当前专利权人: Eastman Kodak Company
- 当前专利权人地址: US NY Rochester
- 代理商 Raymond L. Owens
- 主分类号: B41J2/175
- IPC分类号: B41J2/175 ; G01L7/20 ; G01L9/00 ; G01F5/00 ; G01L7/18
摘要:
A method of measuring absolute static pressure in a microfluidic device transporting a working fluid that is immiscible in a first selected gas environment, includes providing a first fluid conducting channel having an atmosphere provided by the first selected gas environment in a sealed environment and in communication with the microfluidic device at a first point of communication; providing a first sensing mechanism that is electrically interrogated, disposed adjacent to the first fluid conducting channel; and transporting the working fluid under pressure conducted by the microfluidic device into the first fluid conducting channel such that the volume transported into such first fluid conducting channel varies depending upon the absolute static pressure of the working fluid.
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