发明授权
- 专利标题: Scanning heat flow probe
- 专利标题(中): 扫描热流探头
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申请号: US10348541申请日: 2003-01-21
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公开(公告)号: US06866415B2公开(公告)日: 2005-03-15
- 发明人: Steven Alan Cordes , David R. DiMilia , James Patrick Doyle , Matthew James Farinelli , Snigdha Ghoshal , Uttam Shyamalindu Ghoshal , Chandler Todd McDowell , Li Shi
- 申请人: Steven Alan Cordes , David R. DiMilia , James Patrick Doyle , Matthew James Farinelli , Snigdha Ghoshal , Uttam Shyamalindu Ghoshal , Chandler Todd McDowell , Li Shi
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理商 Duke W. Yee; Casimer K. Salys; Stephen J. Walder, Jr.
- 主分类号: G01K17/20
- IPC分类号: G01K17/20 ; G01K17/00 ; G01K15/00
摘要:
A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.
公开/授权文献
- US20030169798A1 Scanning heat flow probe 公开/授权日:2003-09-11
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