发明授权
US06875649B2 Methods for manufacturing integrated circuit devices including an isolation region defining an active region area
有权
用于制造集成电路器件的方法,包括限定有源区域区域的隔离区域
- 专利标题: Methods for manufacturing integrated circuit devices including an isolation region defining an active region area
- 专利标题(中): 用于制造集成电路器件的方法,包括限定有源区域区域的隔离区域
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申请号: US10686421申请日: 2003-10-15
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公开(公告)号: US06875649B2公开(公告)日: 2005-04-05
- 发明人: Yong-chul Oh , Gyo-young Jin
- 申请人: Yong-chul Oh , Gyo-young Jin
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel Sibley & Sajovec
- 优先权: KR2001-42355 20010713
- 主分类号: H01L21/76
- IPC分类号: H01L21/76 ; H01L21/762 ; H01L21/8234 ; H01L21/331 ; H01L29/00 ; H01L29/76 ; H01L29/94
摘要:
Integrated circuit devices including an isolation region are provided. The devices include an integrated circuit substrate and a trench in the integrated circuit substrate that defines an active region of the integrated circuit device. A silicon layer is provided on the integrated circuit substrate that extends over an edge of the trench and along an upper portion of a first sidewall of the trench. An insulating material is positioned adjacent the silicon layer that extends across some, or all, of the trench to define the isolation region. Methods of forming such integrated circuit devices are also provided.
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