发明授权
- 专利标题: Method and apparatus for analyzing electromagnetic interference
- 专利标题(中): 用于分析电磁干扰的方法和装置
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申请号: US09993595申请日: 2001-11-27
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公开(公告)号: US06876210B2公开(公告)日: 2005-04-05
- 发明人: Kenji Shimazaki , Shouzou Hirano , Tatsuo Ohhashi , Takashi Mizokawa , Hiroyuki Tsujikawa
- 申请人: Kenji Shimazaki , Shouzou Hirano , Tatsuo Ohhashi , Takashi Mizokawa , Hiroyuki Tsujikawa
- 申请人地址: JP Osaka
- 专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址: JP Osaka
- 代理机构: McDermott Will & Emery LLP
- 优先权: JPP2000-359630 20001127
- 主分类号: G01R29/08
- IPC分类号: G01R29/08 ; G01R31/00 ; G01R31/28 ; G06F17/50 ; H01L21/82 ; G01R31/302
摘要:
A method of analyzing electromagnetic interference in which an amount of electromagnetic interference from an LSI is analyzed, wherein the method includes: an equivalent power source current information calculating step of calculating information of an equivalent power source current flowing in a power source current, from circuit information of the LSI chip; an estimating step of considering at least one of power source information of a power source for supplying a current to the LSI chip, package information of a package for the semiconductor chip, and measurement system information of a measurement system for measuring characteristics of the semiconductor chip, as analysis control information, and of estimating total information in which the analysis control information is reflected in the circuit information, as an equivalent circuit; and a total information analyzing step of performing analysis in accordance with the total information which is estimated in the estimating step.
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