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    Method for optimizing electromagnetic interference and method for analyzing the electromagnetic interference
    1.
    发明授权
    Method for optimizing electromagnetic interference and method for analyzing the electromagnetic interference 有权
    电磁干扰优化方法及电磁干扰分析方法

    公开(公告)号：US06782347B2

    公开(公告)日：2004-08-24

    申请号：US09993965

    申请日：2001-11-27

    申请人： Shouzou Hirano ,  Takashi Mizokawa ,  Tatsuo Ohhashi ,  Kenji Shimazaki ,  Hiroyuki Tsujikawa

    发明人： Shouzou Hirano ,  Takashi Mizokawa ,  Tatsuo Ohhashi ,  Kenji Shimazaki ,  Hiroyuki Tsujikawa

    IPC分类号： G06F308

    CPC分类号： G06F17/5036 ,  Y02T10/82

    摘要： A method for optimizing electromagnetic interference (EMI) comprising: an EMI analyzing step of analyzing a quantity of electromagnetic interference of an LSI by execution of simulation; a step of selecting an instance with a large quantity of noise in said EMI analyzing step; and a step of adjusting a driving capability of said instance so that it is lowered to an extent that a delay does not occur in a signal timing of said instance selected. In order to optimize the analyzed EMI, the portion for which optimizing is required is extracted, and such a measure as increasing the area where the decoupling capacitance is created is implemented for this portion in a necessary degree. Further, by changing the aspect ratio of the block, changing the block position or changing the cell line, the decoupling capacitance can be easily created at the most efficient inserting position.

    摘要翻译： 一种用于优化电磁干扰（EMI）的方法，包括：EMI分析步骤，通过执行仿真分析LSI的电磁干扰量; 在所述EMI分析步骤中选择具有大量噪声的实例的步骤; 以及调整所述实例的驱动能力以使其降低到在所选择的所述实例的信号定时中不发生延迟的程度的步骤。 为了优化分析的EMI，提取需要优化的部分，并且在必要的程度上对该部分实现增加去耦电容的面积增加的措施。 此外，通过改变块的纵横比，改变块位置或改变单元行，可以在最有效的插入位置容易地创建去耦电容。

    Method and apparatus for analyzing electromagnetic interference
    2.
    发明授权
    Method and apparatus for analyzing electromagnetic interference 失效
    用于分析电磁干扰的方法和装置

    公开(公告)号：US06876210B2

    公开(公告)日：2005-04-05

    申请号：US09993595

    申请日：2001-11-27

    申请人： Kenji Shimazaki ,  Shouzou Hirano ,  Tatsuo Ohhashi ,  Takashi Mizokawa ,  Hiroyuki Tsujikawa

    发明人： Kenji Shimazaki ,  Shouzou Hirano ,  Tatsuo Ohhashi ,  Takashi Mizokawa ,  Hiroyuki Tsujikawa

    IPC分类号： G01R29/08 ,  G01R31/00 ,  G01R31/28 ,  G06F17/50 ,  H01L21/82 ,  G01R31/302

    CPC分类号： G06F17/5022 ,  G01R31/002

    摘要： A method of analyzing electromagnetic interference in which an amount of electromagnetic interference from an LSI is analyzed, wherein the method includes: an equivalent power source current information calculating step of calculating information of an equivalent power source current flowing in a power source current, from circuit information of the LSI chip; an estimating step of considering at least one of power source information of a power source for supplying a current to the LSI chip, package information of a package for the semiconductor chip, and measurement system information of a measurement system for measuring characteristics of the semiconductor chip, as analysis control information, and of estimating total information in which the analysis control information is reflected in the circuit information, as an equivalent circuit; and a total information analyzing step of performing analysis in accordance with the total information which is estimated in the estimating step.

    摘要翻译： 一种分析其中分析来自LSI的电磁干扰量的电磁干扰的方法，其中所述方法包括：等效电源电流信息计算步骤，从电路中计算流过电源电流的等效电源电流的信息， LSI芯片的信息; 考虑将用于向LSI芯片提供电流的电源的电源信息，半导体芯片的封装的封装信息以及用于测量半导体芯片的特性的测量系统的测量系统信息中的至少一个的估计步骤 作为分析控制信息，并且将分析控制信息反映在电路信息中的总信息估计为等效电路; 以及总信息分析步骤，根据在估计步骤中估计的总信息进行分析。