发明授权
US06884673B2 Methods of forming integrated circuit devices having metal-insulator-metal (MIM) capacitor 有权
形成具有金属 - 绝缘体 - 金属(MIM)电容器的集成电路器件的方法

Methods of forming integrated circuit devices having metal-insulator-metal (MIM) capacitor
摘要:
In some embodiments, an integrated circuit device includes a substrate and an interlevel-insulating layer on the substrate that has a hole therein that exposes the substrate. A unitary lower electrode of a capacitor is disposed on the substrate and has a contact plug portion thereof that is disposed in the hole. A dielectric layer is on the lower electrode and an upper electrode of the capacitor is on the dielectric layer. In other embodiments, an integrated circuit device includes a substrate and an interlevel-insulating layer on the substrate that has a hole therein that exposes the substrate. A barrier layer is disposed on the exposed portion of the substrate and on sidewalls of the interlevel-insulating layer. A contact plug is disposed in the hole on the barrier layer. A lower electrode of a capacitor is disposed on the contact plug and engages the contact plug at a boundary therebetween. A dielectric layer is on the lower electrode and an upper electrode of the capacitor is on the dielectric layer.
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