发明授权
US06891494B2 Layout method of a comparator array for flash type analog to digital converting circuit
有权
用于闪存类型模数转换电路的比较器阵列的布局方法
- 专利标题: Layout method of a comparator array for flash type analog to digital converting circuit
- 专利标题(中): 用于闪存类型模数转换电路的比较器阵列的布局方法
-
申请号: US10687084申请日: 2003-10-16
-
公开(公告)号: US06891494B2公开(公告)日: 2005-05-10
- 发明人: Hee-Cheol Choi
- 申请人: Hee-Cheol Choi
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Mills & Onello LLP
- 优先权: KR10-2002-0065286 20021024
- 主分类号: H03M1/12
- IPC分类号: H03M1/12 ; H03M1/06 ; H03M1/36
摘要:
The present invention discloses a layout method of a comparator array of a flash type analog to digital converting circuit. The flash type analog to digital converting circuit includes a reference voltage for generating 2n −Ivoltages and being arranged to be folded; a comparator array including (2n−1) comparators for comparing voltage differences between the respective 2n −Ivoltages and an analog input signal to generate a digital thermometer code having (2n−1) bits and an encoder for encoding the digital thermometer code having (2n−1) bits to generate an n-bit digital signal. The layout method of the flash type analog to digital converting circuit comprises arranging the comparators such that the comparators of (2n−1)th comparator to (2n/2)th comparator are arranged in order and the comparators of (2n/2−1)th comparator to a first comparator are arranged in reverse fashion between the comparators of the (2n−1)th comparator to the (2n/2)th comparator; and arranging the comparators such that the neighboring comparators adjacent to the respective (2n−1) comparators remain at to the same state when the (2n−1)th comparator to the (2n/2)th comparator transit to different states respectively. Therefore, increasing of an offset voltage due to the effects of the neighboring comparators is prevented without increasing a layout area size.
公开/授权文献
信息查询