Invention Grant
- Patent Title: Production method for a halftone phase mask
- Patent Title (中): 半色调相位掩模的制作方法
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Application No.: US10254405Application Date: 2002-09-25
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Publication No.: US06919147B2Publication Date: 2005-07-19
- Inventor: Josef Mathuni , Gunther Ruhl
- Applicant: Josef Mathuni , Gunther Ruhl
- Applicant Address: DE München
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE München
- Agency: Jenkins, Wilson & Taylor, P.A.
- Main IPC: C03C17/34
- IPC: C03C17/34 ; C03C17/36 ; G03F1/00 ; G03F1/32 ; G03F1/80 ; G03F1/08 ; C23F1/00

Abstract:
The present invention provides a production method for a halftone phase mask which has an SiO2 substrate, an overlying refractory metal SixNy phase shifter layer (2) and an overlying chromium oxide or chromium mask layer (3), having the following steps: provision of a mask (4) on the chromium oxide or chromium mask layer (3); etching of the chromium oxide or chromium mask layer (3) for the purpose of forming a hard mask from the chromium oxide or chromium mask layer (3) in a first etching step; selective etching of the refractory metal SixNy phase shifter layer (2) using the hard mask in a plasma with a chlorine-containing and/or hydrogen-chloride-containing main gas in a second etching step with a predetermined cathode power of at least 20 W.
Public/Granted literature
- US20040058252A1 Production method for a halftone phase mask Public/Granted day:2004-03-25
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