发明授权
- 专利标题： Method and apparatus for characterization of devices and circuits
- 专利标题（中）： 用于表征器件和电路的方法和装置
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申请号： US10365101申请日： 2003-02-12
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公开(公告)号： US06921195B2公开(公告)日： 2005-07-26
- 发明人: Kevin P. Pipe , Rajeev J. Ram
- 申请人： Kevin P. Pipe , Rajeev J. Ram
- 申请人地址： US MA Cambridge
- 专利权人： Massachusetts Institute of Technology
- 当前专利权人： Massachusetts Institute of Technology
- 当前专利权人地址： US MA Cambridge
- 代理机构： Daly, Crowley, Mofford & Durkee, LLP
- 主分类号： G01K3/00
- IPC分类号： G01K3/00 ; G01N25/18 ; G01N25/00 ; G01K17/20
摘要：
A method and apparatus for performing characterization of devices is presented. The characteristic of the device are determined by obtaining a first temperature measurement in a first location of a device, obtaining a second temperature measurement, computing the difference between the temperature measurements and, using the temperatures and/or the temperature difference, a characteristic of the device is determined.
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