发明授权
- 专利标题： Adaptive test program generation
- 专利标题（中）： 自适应测试程序生成
-
申请号： US10040940申请日： 2002-01-09
-
公开(公告)号： US06925405B2公开(公告)日： 2005-08-02
- 发明人: Allon Adir , Roy Emek , Eitan Marcus
- 申请人： Allon Adir , Roy Emek , Eitan Marcus
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理机构： Browdy and Neimark, P.L.L.C.
- 主分类号： G01R27/28
- IPC分类号： G01R27/28 ; G06F11/263 ; G06F19/00
摘要：
A test program generator that produces test instructions according to a specification of a system being verified. The instructions are typically generated randomly, at least in part, and are then. The system is capable of interpreting events, detecting an impending occurrence of an event, and responding to the event by switching to an alternate input stream.
公开/授权文献
- US20030130813A1 Adaptive test program generation 公开/授权日：2003-07-10
信息查询
