Invention Grant
- Patent Title: Stacked 1T-nMTJ MRAM structure
- Patent Title (中): 堆叠1T-nMTJ MRAM结构
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Application No.: US10146113Application Date: 2002-05-16
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Publication No.: US06940748B2Publication Date: 2005-09-06
- Inventor: Hasan Nejad , Mirmajid Seyyedy
- Applicant: Hasan Nejad , Mirmajid Seyyedy
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dickstein Shapiro Morin & Oshinsky LLP
- Main IPC: G11C11/15
- IPC: G11C11/15 ; G11C11/16 ; H01L21/8246 ; H01L27/22 ; G11C11/14

Abstract:
This invention relates to MRAM technology and new variations on MRAM array architecture to incorporate certain advantages from both cross-point and 1T-1MTJ architectures. The fast read-time and higher signal-to-noise ratio of the 1T-1MTJ architecture and the higher packing density of the cross-point architecture are both exploited by combining certain characteristics of these layouts. A single access transistor 16 is used to read multiple MRAM cells, which can be stacked vertically above one another a plurality of MRAM array layers arranged in a “Z” axis direction.
Public/Granted literature
- US20030214835A1 STACKED 1T-NMTJ MRAM STRUCTURE Public/Granted day:2003-11-20
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