发明授权
- 专利标题: Z-slope test to optimize sample throughput
- 专利标题(中): Z斜率测试以优化样品通量
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申请号: US10094947申请日: 2002-03-11
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公开(公告)号: US06943791B2公开(公告)日: 2005-09-13
- 发明人: Mark E. Pascual , Michael G. Lavelle , Michael F. Deering , Nandini Ramani
- 申请人: Mark E. Pascual , Michael G. Lavelle , Michael F. Deering , Nandini Ramani
- 申请人地址: US CA Santa Clara
- 专利权人: Sun Microsystems, Inc.
- 当前专利权人: Sun Microsystems, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- 代理商 Jeffrey C. Hood
- 主分类号: G06T15/00
- IPC分类号: G06T15/00 ; G06T15/40
摘要:
A system and method are disclosed for utilizing a Z slope test to select polygons that may be candidates for multiple storage methods. The method may calculate the absolute Z slope from vertex data and compare the calculated value with a specified threshold value. In some embodiments, for polygons that have an absolute Z slope less than the threshold value, parameter values may be rendered for only one sample position of multiple neighboring sample positions. The parameter values rendered for the one sample position may then be stored in multiple memory locations that correspond to the multiple neighboring sample positions. In some embodiments, storing parameter values in multiple memory locations may be achieved in a single write transaction. In some embodiments, utilization of the Z slope test method may be subject to user input and in other embodiments may be a dynamic decision controlled by the graphics system.
公开/授权文献
- US20030169252A1 Z-slope test to optimize sample throughput 公开/授权日:2003-09-11
信息查询
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |