Invention Grant
- Patent Title: Method and apparatus for measuring strain using a luminescent photoelastic coating
- Patent Title (中): 使用发光光弹性涂层测量应变的方法和装置
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Application No.: US10407602Application Date: 2003-04-04
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Publication No.: US06943869B2Publication Date: 2005-09-13
- Inventor: James P. Hubner , Peter G. Ifju , Kirk S. Schanze , Shujun Jiang , Yao Liu , David A. Jenkins
- Applicant: James P. Hubner , Peter G. Ifju , Kirk S. Schanze , Shujun Jiang , Yao Liu , David A. Jenkins
- Applicant Address: US FL Gainesville US MI Dearborn
- Assignee: Resesarch Foundation, Inc.,Visteon Global Technologies, Inc.
- Current Assignee: Resesarch Foundation, Inc.,Visteon Global Technologies, Inc.
- Current Assignee Address: US FL Gainesville US MI Dearborn
- Agency: Akerman Senterfitt
- Main IPC: G01B11/16
- IPC: G01B11/16 ; G01L1/24

Abstract:
A method and apparatus for measuring strain on a surface of a substrate utilizes a substrate surface coated with at least one coating layer. The coating layer provides both luminescence and photoelasticity. The coating layer is illuminated with excitation light, wherein longer wavelength light is emitted having a polarization dependent upon stress or strain in the coating. At least one characteristic of the emitted light is measured, and strain (if present) on the substrate is determined from the measured characteristic.
Public/Granted literature
- US20040066503A1 Method and apparatus for measuring strain using a luminescent photoelastic coating Public/Granted day:2004-04-08
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