公开(公告)号：US06943869B2

公开(公告)日：2005-09-13

申请号：US10407602

申请日：2003-04-04

Applicant: James P. Hubner ,  Peter G. Ifju ,  Kirk S. Schanze ,  Shujun Jiang ,  Yao Liu ,  David A. Jenkins

Inventor： James P. Hubner ,  Peter G. Ifju ,  Kirk S. Schanze ,  Shujun Jiang ,  Yao Liu ,  David A. Jenkins

IPC: G01B11/16 ,  G01L1/24

CPC classification number: G01L1/241 ,  G01B11/18

Abstract: A method and apparatus for measuring strain on a surface of a substrate utilizes a substrate surface coated with at least one coating layer. The coating layer provides both luminescence and photoelasticity. The coating layer is illuminated with excitation light, wherein longer wavelength light is emitted having a polarization dependent upon stress or strain in the coating. At least one characteristic of the emitted light is measured, and strain (if present) on the substrate is determined from the measured characteristic.

Abstract translation: 用于测量衬底表面上的应变的方法和装置利用涂覆有至少一个涂层的衬底表面。 涂层提供发光和光弹性。 用激发光照射涂层，其中发射具有取决于涂层中的应力或应变的偏振的较长波长的光。 测量发射光的至少一个特性，并根据测量的特性确定衬底上的应变（如果存在）。

公开(公告)号：US20060007424A1

公开(公告)日：2006-01-12

申请号：US11225141

申请日：2005-09-13

Applicant: James Hubner ,  Peter Ifju ,  Kirk Schanze ,  Shujun Jiang ,  Yao Liu ,  David Jenkins

Inventor： James Hubner ,  Peter Ifju ,  Kirk Schanze ,  Shujun Jiang ,  Yao Liu ,  David Jenkins

IPC: G01B11/16

CPC classification number: G01L1/241 ,  G01B11/18

Abstract: A method and apparatus for measuring strain on a surface of a substrate utilizes a substrate surface coated with at least one coating layer. The coating layer provides both luminescence and photoelasticity. The coating layer is illuminated with excitation light, wherein longer wavelength light is emitted having a polarization dependent upon stress or strain in the coating. At least one characteristic of the emitted light is measured, and strain (if present) on the substrate is determined from the measured characteristic.

Abstract translation: 用于测量衬底表面上的应变的方法和装置利用涂覆有至少一个涂层的衬底表面。 涂层提供发光和光弹性。 用激发光照射涂层，其中发射具有取决于涂层中的应力或应变的偏振的较长波长的光。 测量发射光的至少一个特性，并根据测量的特性确定衬底上的应变（如果存在）。