发明授权
- 专利标题: Process for electroplating metal into microscopic recessed features
- 专利标题(中): 将金属电镀成微观凹陷特征的工艺
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申请号: US09716016申请日: 2000-11-16
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公开(公告)号: US06946065B1公开(公告)日: 2005-09-20
- 发明人: Steven T. Mayer , Vijay Bhaskaran , Evan E. Patton , Robert L. Jackson , Jonathan Reid
- 申请人: Steven T. Mayer , Vijay Bhaskaran , Evan E. Patton , Robert L. Jackson , Jonathan Reid
- 申请人地址: US CA San Jose
- 专利权人: Novellus Systems, Inc.
- 当前专利权人: Novellus Systems, Inc.
- 当前专利权人地址: US CA San Jose
- 代理机构: Beyer, Weaver & Thomas, LLP.
- 主分类号: C25D3/38
- IPC分类号: C25D3/38 ; C25D5/18 ; H05K3/42 ; H01L21/768
摘要:
Several techniques are described for reducing or mitigating the formation of seams and/or voids in electroplating the interior regions of microscopic recessed features. Cathodic polarization is used to mitigate the deleterious effects of introducing a substrate plated with a seed layer into an electroplating solution. Also described are diffusion-controlled electroplating techniques to provide for bottom-up filling of trenches and vias, avoiding thereby sidewalls growing together to create seams/voids. A preliminary plating step is also described that plates a thin film of conductor on the interior surfaces of features leading to adequate electrical conductivity to the feature bottom, facilitating bottom-up filling.
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