发明授权
US06954096B2 Semiconductor integrated circuit device having a sampling signal generation circuit
有权
具有采样信号发生电路的半导体集成电路装置
- 专利标题: Semiconductor integrated circuit device having a sampling signal generation circuit
- 专利标题(中): 具有采样信号发生电路的半导体集成电路装置
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申请号: US10760489申请日: 2004-01-21
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公开(公告)号: US06954096B2公开(公告)日: 2005-10-11
- 发明人: Kenji Ito , Takuya Harada , Hirofumi Isomura
- 申请人: Kenji Ito , Takuya Harada , Hirofumi Isomura
- 申请人地址: JP Kariya
- 专利权人: Denso Corporation
- 当前专利权人: Denso Corporation
- 当前专利权人地址: JP Kariya
- 代理机构: Posz Law Group, PLC
- 优先权: JP2003-013492 20030122
- 主分类号: H02P7/29
- IPC分类号: H02P7/29 ; H03K3/017 ; H03K5/00 ; H03K5/06 ; H03K19/003 ; H03M1/08
摘要:
A semiconductor integrated circuit device is provided to reduce the adverse effect of PWM noise occurring in a PWM driving section on an analog voltage processing section in an IC, in which digital and analog circuits are combined on a single chip. A sampling signal generation circuit outputs a sampling signal St to an A/D converter at a predetermined time when “delay time td+allowance time ta” has elapsed from a start signal Sp. The delay time td is shorter than “the minimum time width of H level of PWM signal SPWM1−allowance time ta”. The delay time td is also time from the variation of level of the PWM signal SPWM1 to actual variation in the passage of current through a power section.
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