发明授权
US06956225B1 Method and apparatus for selective pre-dispersion of extracted ion beams in ion implantation systems
失效
在离子注入系统中选择性预分散萃取离子束的方法和装置
- 专利标题: Method and apparatus for selective pre-dispersion of extracted ion beams in ion implantation systems
- 专利标题(中): 在离子注入系统中选择性预分散萃取离子束的方法和装置
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申请号: US10815586申请日: 2004-04-01
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公开(公告)号: US06956225B1公开(公告)日: 2005-10-18
- 发明人: Victor M. Benveniste
- 申请人: Victor M. Benveniste
- 申请人地址: US MA Beverly
- 专利权人: Axcelis Technologies, Inc.
- 当前专利权人: Axcelis Technologies, Inc.
- 当前专利权人地址: US MA Beverly
- 代理机构: Eschweiler & Associates, LLC
- 主分类号: H01J37/05
- IPC分类号: H01J37/05 ; H01J37/317
摘要:
Ion implantation systems are provided, comprising a dispersion system located between an ion source and a mass analyzer, that operates to selectively pass an extracted ion beam from the ion source toward the mass analyzer or to direct a dispersed ion beam toward the mass analyzer, where the dispersed ion beam has fewer ions of an undesired mass range than the extracted ion beam.
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