发明授权
US06967892B2 Non-volatile semiconductor memory device and memory system using the same 失效
非易失性半导体存储器件和使用其的存储器系统

Non-volatile semiconductor memory device and memory system using the same
摘要:
The time required for the program verify and erase verify operations can be shortened. The change of threshold values of memory cells can be suppressed even if the write and erase operations are executed repetitively. After the program and erase operations, whether the operations were properly executed can be judged simultaneously for all bit lines basing upon a change, after the pre-charge, of the potential at each bit line, without changing the column address. In the data rewrite oepration, the rewrite operation is not effected for a memory cell with the data once properly written, by changing the data in the data register.
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