发明授权
- 专利标题: Electromagnetic alignment and scanning apparatus
- 专利标题(中): 电磁对准和扫描装置
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申请号: US10974787申请日: 2004-10-28
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公开(公告)号: US06969966B2公开(公告)日: 2005-11-29
- 发明人: Akimitsu Ebihara , Thomas Novak
- 申请人: Akimitsu Ebihara , Thomas Novak
- 申请人地址: JP Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff & Berridge PLC
- 优先权: JP10-49098 19980302
- 主分类号: B64C17/06
- IPC分类号: B64C17/06 ; G03B27/42 ; G03F7/20 ; G03F9/00 ; H01L21/027
摘要:
In a scanning exposure method, a mask stage that holds a mask is moved in a scanning direction by a first electromagnetic driver having a first portion coupled to the mask stage, and a second portion. A position of the mask stage is detected by a position detector that cooperates with a reflective portion of the mask stage that is positioned along the scanning direction. A counter weight having a bearing and at least one beam extending along the scanning direction moves in a direction opposite to a movement direction of the mask stage in response to a reaction force generated by movement of the mask stage by the first electromagnetic driver. The counter weight preferably is heavier than the mask stage, and a length of the at least one beam along the scanning direction preferably is longer than a length of the reflective portion along the scanning direction.
公开/授权文献
- US20050083006A1 Electromagnetic alignment and scanning apparatus 公开/授权日:2005-04-21
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